[IEEE 2017 IEEE Compound Semiconductor Integrated Circuit...

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[IEEE 2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - Miami, FL (2017.10.22-2017.10.25)] 2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - The interplay of thermal, time and Poole-Frenkel emission on the trap-based physical modeling of GaN HEMT drain characteristics

Chen, Chung-hsu, Sadler, Robert, Wang, Dave, Hou, Daniel, Yang, Yuefei, Yau, Wing, Wang, Shiguang, Wu, Mo, Wu, Tingyi, Chen, Rex, Ou, Benjamin
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Year:
2017
DOI:
10.1109/CSICS.2017.8240427
File:
PDF, 528 KB
2017
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