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[IEEE 2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - Miami, FL (2017.10.22-2017.10.25)] 2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - Innovative submicron thermal characterization method for AlGaN/GaN power HEMTs with hyperspectral thermoreflectance imaging
Brocero, G., Kendig, D., Shakouri, A., Guhel, Y., Eudeline, Ph., Sipma, J-P, Boudart, B.Year:
2017
Language:
english
DOI:
10.1109/CSICS.2017.8240438
File:
PDF, 656 KB
english, 2017