USER-SMILE: Ultrafast Stimulus Error Removal and Segmented...

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IEEE Transactions on Circuits and Systems I: Regular Papers 2017

USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test

Chen, Tao, Jin, Xiankun, Geiger, Randall L., Chen, Degang
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/TCSI.2017.2775632
File:
PDF, 3.42 MB
english, 2017
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