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Understanding BTI in SiC MOSFETs and its impact on circuit operation
Puschkarsky, Katja, Reisinger, Hans, Aichinger, Thomas, Gustin, Wolfgang, Grasser, TiborYear:
2018
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2018.2813063
File:
PDF, 1.57 MB
english, 2018