Comparison Between High-Holding-Voltage SCR and Stacked...

IEEE Transactions on Electron Devices 2018 / 2 Vol. 65; Iss. 2

Comparison Between High-Holding-Voltage SCR and Stacked Low-Voltage Devices for ESD Protection in High-Voltage Applications

Dai, Chia-Tsen, Ker, Ming-Dou
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2785121
Date:
February, 2018
File:
PDF, 1.87 MB
english, 2018
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