[IEEE 2017 International Conference on Optical MEMS and Nanophotonics (OMN) - Santa Fe, NM, USA (2017.8.13-2017.8.17)] 2017 International Conference on Optical MEMS and Nanophotonics (OMN) - Two-axis MEMS scanner in a resonance operation for diagnosis of middle ear diseases
Lee, Jaekwon, Lee, Sang-Jin, Moon, Seunghwan, Park, Yangkyu, Kim, Kwanghyun, Lee, Jong-HyunYear:
2017
Language:
english
DOI:
10.1109/omn.2017.8051466
File:
PDF, 375 KB
english, 2017