[ASME ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - Long Beach, California, USA (September 24–28, 2005)] Volume 2: 31st Design Automation Conference, Parts A and B - Tolerance-Maps Applied to a Point-Line Cluster of Features
Ameta, Gaurav, Davidson, Joseph K., Shah, Jami J.Volume:
2005
Year:
2005
Language:
english
DOI:
10.1115/detc2005-85115
File:
PDF, 327 KB
english, 2005