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[IEEE 2017 Silicon Nanoelectronics Workshop (SNW) - Kyoto (2017.6.4-2017.6.5)] 2017 Silicon Nanoelectronics Workshop (SNW) - Carrier-separated equivalent circuit modeling for steep subthreshold slope PN-body tied SOI FET
Ueda, Daiki, Takeuchi, Kiyoshi, Kobayashi, Masaharu, Hiramoto, ToshiroYear:
2017
Language:
english
DOI:
10.23919/SNW.2017.8242273
File:
PDF, 1.19 MB
english, 2017