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[IEEE 2017 Silicon Nanoelectronics Workshop (SNW) - Kyoto (2017.6.4-2017.6.5)] 2017 Silicon Nanoelectronics Workshop (SNW) - Uniformity improvement of SiNjc-based resistive switching memory by suppressed internal overshoot current
Kim, Min-Hwi, Kim, Sungjun, Bang, Suhyun, Kim, Tae-Hyeon, Lee, Dong Keun, Cho, Seongjae, Lee, Jong-Ho, Park, Byung-GookYear:
2017
Language:
english
DOI:
10.23919/SNW.2017.8242276
File:
PDF, 1.97 MB
english, 2017