[IEEE 2017 Silicon Nanoelectronics Workshop (SNW) - Kyoto, Japan (2017.6.4-2017.6.5)] 2017 Silicon Nanoelectronics Workshop (SNW) - Suppressed Fin-LER induced variability in negative capacitance FinFETs
Lee, Ho-Pei, Su, PinYear:
2017
Language:
english
DOI:
10.23919/SNW.2017.8242282
File:
PDF, 2.14 MB
english, 2017