Characterization of Dislocations in Semiconductor...

Journal of Electronic Materials 2018 / 2 Vol. 47; Iss. 2

Characterization of Dislocations in Semiconductor Heterostructures Using X-ray Rocking Curve Pendellösung

Althowibi, Fahad A., Ayers, John E.
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Volume:
47
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-017-5895-9
Date:
February, 2018
File:
PDF, 2.28 MB
english, 2018
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