A PVT resilient short-time measurement solution for on-chip...

A PVT resilient short-time measurement solution for on-chip testing

Jedari, Esrafil, Rashidzadeh, Rashid, Saif, Mehrdad

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Volume:

Language:

english

Journal:

Microelectronics Journal

DOI:

10.1016/j.mejo.2018.02.005

Date:

May, 2018

File:

PDF, 2.83 MB

english, 2018

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