Single-shot full strain tensor determination with microbeam...

Journal of Applied Crystallography 2017 / 06 Vol. 50; Iss. 3

Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

Abboud, A., Kirchlechner, C., Keckes, J., Conka Nurdan, T., Send, S., Micha, J. S., Ulrich, O., Hartmann, R., Strüder, L., Pietsch, U.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
50
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576717005581
Date:
June, 2017
File:
PDF, 994 KB
english, 2017
Conversion to is in progress
Conversion to is failed