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[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - A new 3-bit burst-error correcting code
Klockmann, A., Georgakos, G., Goessel, M.Year:
2017
Language:
english
DOI:
10.1109/IOLTS.2017.8046167
File:
PDF, 147 KB
english, 2017