![](/img/cover-not-exists.png)
[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - ESD-induced latchup-like failure in a touch panel control IC
Ker, Ming-Dou, Chiu, Po-Yen, Shieh, Wuu-Trong, Wang, Chun-ChiYear:
2017
DOI:
10.1109/IPFA.2017.8060061
File:
PDF, 1.42 MB
2017