[IEEE Comput. Soc Design, Automation and Test in Europe...

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[IEEE Comput. Soc Design, Automation and Test in Europe Conference and Exhibition - Paris, France (16-20 Feb. 2004)] Proceedings. Design, Automation and Test in Europe Conference and Exhibition - Value-conscious cache: simple technique for reducing cache access power

Yen-Jen Chang,, Chia-Lin Yang,, Feipei Lai,
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Year:
2004
Language:
english
DOI:
10.1109/date.2004.1268821
File:
PDF, 268 KB
english, 2004
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