A Model-Based-Random-Forest Framework for Predicting Vt...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2017

A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement

Lin, Chien-Hsueh, Tsai, Chih-Ying, Lee, Kao-Chi, Yu, Sung-Chu, Liau, Wen-Rong, Hou, Alex Chun-Liang, Chen, Ying-Yen, Kuo, Chun-Yi, Lee, Jih-Nung, Chao, Mango C.-T.
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2017.2783304
File:
PDF, 5.51 MB
english, 2017
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