Direct observation of inversion capacitance in p-type...

Japanese Journal of Applied Physics 2018 / 04 Vol. 57; Iss. 4S

Direct observation of inversion capacitance in p-type diamond MOS capacitors with an electron injection layer

Matsumoto, Tsubasa, Kato, Hiromitsu, Makino, Toshiharu, Ogura, Masahiko, Takeuchi, Daisuke, Yamasaki, Satoshi, Imura, Masataka, Ueda, Akihiro, Inokuma, Takao, Tokuda, Norio
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Volume:
57
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.04FR01
Date:
April, 2018
File:
PDF, 683 KB
english, 2018
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