[IEEE 2017 Second International Conference on Reliability Systems Engineering (ICRSE) - Beijing, China (2017.7.10-2017.7.12)] 2017 Second International Conference on Reliability Systems Engineering (ICRSE) - Software defect prediction based on class-association rules
Shao, Yuanxun, Liu, Bin, Li, Guoqi, Wang, ShihaiYear:
2017
Language:
english
DOI:
10.1109/ICRSE.2017.8030774
File:
PDF, 4.15 MB
english, 2017