[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Strasbourg, France (2016.10.29-2016.11.6)] 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - PFM2: A 32 × 32 readout chip for the PixFEL X-ray imager demonstrator
Ratti, L., Comotti, D., Fabris, L., Grassi, M., Lodola, L., Malcovati, P., Manghisoni, M., Re, V., Traversi, G., Vacchi, C., Batignani, G., Bettarini, S., Casarosa, G., Forti, F., Morsani, F., PaladinYear:
2016
Language:
english
DOI:
10.1109/NSSMIC.2016.8069724
File:
PDF, 642 KB
english, 2016