[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2017.10.16-2017.10.19)] 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - An implementation of 2RW dual-port SRAM using 65 nm Silicon-on-Thin-Box (SOTB) for smart IoT

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