![](/img/cover-not-exists.png)
[Advances in Imaging and Electron Physics] || Electron Optics of Low-Voltage Electron Beam Testing and Inspection. Part I: Simulation Tools ✶ ✶Reprinted from Advances in Optical and Electron Microscopy, vol. 13, 1994, 123–242.
Plies, ErichYear:
2018
Language:
english
DOI:
10.1016/bs.aiep.2017.12.001
File:
PDF, 3.27 MB
english, 2018