[Advances in Imaging and Electron Physics] || Electron...

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[Advances in Imaging and Electron Physics] || Electron Optics of Low-Voltage Electron Beam Testing and Inspection. Part I: Simulation Tools ✶ ✶Reprinted from Advances in Optical and Electron Microscopy, vol. 13, 1994, 123–242.

Plies, Erich
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Year:
2018
Language:
english
DOI:
10.1016/bs.aiep.2017.12.001
File:
PDF, 3.27 MB
english, 2018
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