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Degradation effects of the active region in UV-C light-emitting diodes
Glaab, Johannes, Haefke, Joscha, Ruschel, Jan, Brendel, Moritz, Rass, Jens, Kolbe, Tim, Knauer, Arne, Weyers, Markus, Einfeldt, Sven, Guttmann, Martin, Kuhn, Christian, Enslin, Johannes, Wernicke, TimVolume:
123
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5012608
Date:
March, 2018
File:
PDF, 786 KB
english, 2018