[IEEE 2018 International Conference on Innovative Trends in Computer Engineering (ITCE) - Aswan, Egypt (2018.2.19-2018.2.21)] 2018 International Conference on Innovative Trends in Computer Engineering (ITCE) - Unsupervised patterned fabric defect detection using texture filtering and K-means clustering
Hamdi, Azhar A., Sayed, Mohammed S., Fouad, Mohamed M., Hadhoud, Mohiy M.Year:
2018
Language:
english
DOI:
10.1109/ITCE.2018.8316611
File:
PDF, 1.14 MB
english, 2018