Window Feature-Based Two-Stage Defect Identification Using...

IEEE Transactions on Instrumentation and Measurement 2018 / 1 Vol. 67; Iss. 1

Window Feature-Based Two-Stage Defect Identification Using Magnetic Flux Leakage Measurements

Liu, Jinhai, Fu, Mingrui, Liu, Feilong, Feng, Jian, Cui, Kuangqing
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Volume:
67
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2017.2755918
Date:
January, 2018
File:
PDF, 4.68 MB
english, 2018
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