Characterization of an Ionization Readout Tile for nEXO
Jewell, M., Schubert, A., Cen, W.R., Dalmasson, J., DeVoe, R., Fabris, L., Gratta, G., Jamil, A., Li, G., Odian, A., Patel, M., Pocar, A., Qiu, D., Wang, Q., Wen, L.J., Albert, J.B., Anton, G., ArnquiVolume:
13
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/13/01/P01006
Date:
January, 2018
File:
PDF, 11.35 MB
english, 2018