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[IEEE 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Cambridge (2017.10.23-2017.10.25)] 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Preventing scan-based side-channel attacks through key masking
Ahlawat, Satyadev, Vaghani, Darshit, Singh, VirendraYear:
2017
Language:
english
DOI:
10.1109/DFT.2017.8244434
File:
PDF, 238 KB
english, 2017