[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics...

  • Main
  • [IEEE 2017 IEEE SOI-3D-Subthreshold...

[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2017.10.16-2017.10.19)] 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - High-density SRAM voltage scaling enabled by inserted-oxide FinFET technology

Wu, Yi-Ting, Chiang, Meng-Hsueh, Chen, Jone F., Ding, Fei, Connelly, Daniel, Liu, Tsu-Jae King
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
DOI:
10.1109/S3S.2017.8309217
File:
PDF, 1.50 MB
english, 2017
Conversion to is in progress
Conversion to is failed