Drain Current Saturation in Line Tunneling-Based TFETs: An...

IEEE Transactions on Electron Devices 2018 / 1 Vol. 65; Iss. 1

Drain Current Saturation in Line Tunneling-Based TFETs: An Analog Design Perspective

Acharya, Abhishek, Solanki, Abhishek B., Dasgupta, Sudeb, Anand, Bulusu
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2771249
Date:
January, 2018
File:
PDF, 2.11 MB
english, 2018
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