Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop
Chen, Zhuojun, Ding, Ding, Dong, Yemin, Shan, Yi, Zhou, Shuxing, Hu, Yuanyuan, Zheng, Yunlong, Peng, Chao, Chen, RongmeiYear:
2018
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2018.2812806
File:
PDF, 3.96 MB
english, 2018