Electrical performance and reliability characterization of...

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IEEE Transactions on Power Electronics 2018

Electrical performance and reliability characterization of a SiC MOSFET power module with embedded decoupling capacitors

Yang, Li, Li, Ke, Dai, Jingru, Corfield, Martin, Harris, Anne, Paciura, Krzysztof, O'Brien, John, Johnson, Mark
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2018.2809923
File:
PDF, 694 KB
english, 2018
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