An Efficient Non-Gaussian Sampling Method for High Sigma...

ACM Transactions on Design Automation of Electronic Systems 2018 / 03 Vol. 23; Iss. 3

An Efficient Non-Gaussian Sampling Method for High Sigma SRAM Yield Analysis

Zhai, Jinyuan, Yan, Changhao, Wang, Sheng-Guo, Zhou, Dian, Zhou, Hai, Zeng, Xuan
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Volume:
23
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/3174866
Date:
March, 2018
File:
PDF, 2.14 MB
english, 2018
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