![](/img/cover-not-exists.png)
[IEEE 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Barcelona, Spain (2017.11.22-2017.11.24)] 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Crypto-Test-Lab for security validation of ECC co-processor test infrastructure
Lupon, Emili, Rodriguez-Montanes, Rosa, Manich, SalvadorYear:
2017
Language:
english
DOI:
10.1109/DCIS.2017.8311632
File:
PDF, 275 KB
english, 2017