Fast and Accurate Emissivity and Absolute Temperature Maps...

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2018

Fast and Accurate Emissivity and Absolute Temperature Maps Measurement for Integrated Circuits

Yu, Hsueh-Ling, Li, Yih-Lang, Liao, Tzu-Yi, Wang, Tianchen, Tsai, Shu-Fei, Shi, Yiyu
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2017.2788437
File:
PDF, 2.20 MB
english, 2018
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