[IEEE 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017 - Honololu, HI, USA (2017.6.4-2017.6.9)] 2017 IEEE MTT-S International Microwave Symposium (IMS) - A comprehensive technique for the assessment of microwave circuit design variability through physical simulations
Guerrieri, Simona Donati, Bonani, Fabrizio, Ghione, GiovanniYear:
2017
Language:
english
DOI:
10.1109/mwsym.2017.8058996
File:
PDF, 768 KB
english, 2017