[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - ESD failure analysis and protection design of GaAs power amplifier chip
Hu, Tao, Dong, Shurong, Li, XiangYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060134
File:
PDF, 229 KB
english, 2017