Fatigue behavior of resistive switching in a BiFeO 3 thin film
Zhu, Hui, Yang, Ying, Jiang, Anquan, Bai, Zilong, Meng, Xiao, Feng, ShiweiVolume:
57
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.041501
Date:
April, 2018
File:
PDF, 1.50 MB
english, 2018