Kelvin Probe Force Microscopy and Calculation of Charge...

  • Main
  • 2018 / 03
  • Kelvin Probe Force Microscopy and Calculation of Charge...

Kelvin Probe Force Microscopy and Calculation of Charge Transport in a Graphene/Silicon Dioxide System at Different Relative Humidity

Konečný, Martin, Bartosik, Miroslav, Mach, Jindrich, Švarc, Vojtěch, Nezval, David, Piastek, Jakub, Procházka, Pavel, Cahlík, Aleš, Sikola, Tomas
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.7b18041
Date:
March, 2018
File:
PDF, 2.12 MB
english, 2018
Conversion to is in progress
Conversion to is failed