Kelvin Probe Force Microscopy and Calculation of Charge Transport in a Graphene/Silicon Dioxide System at Different Relative Humidity
Konečný, Martin, Bartosik, Miroslav, Mach, Jindrich, Švarc, Vojtěch, Nezval, David, Piastek, Jakub, Procházka, Pavel, Cahlík, Aleš, Sikola, TomasLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.7b18041
Date:
March, 2018
File:
PDF, 2.12 MB
english, 2018