![](/img/cover-not-exists.png)
Dielectric properties of UV-irradiated ultrathin polysulfone films revealed by surface plasmon resonance method
Pogreb, Roman, Danchuk, Viktor, Whyman, GeneLanguage:
english
Journal:
International Journal of Polymer Analysis and Characterization
DOI:
10.1080/1023666X.2018.1455398
Date:
March, 2018
File:
PDF, 919 KB
english, 2018