[IEEE 2017 Japan-Africa Conference on Electronics,...

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[IEEE 2017 Japan-Africa Conference on Electronics, Communications and Computers (JAC-ECC) - Alexandria, Egypt (2017.12.18-2017.12.20)] 2017 Japan-Africa Conference on Electronics, Communications and Computers (JAC-ECC) - Predicting bug severity using customized weighted majority voting algorithms

Awad, Michael A., ElNainay, Mustafa Y., Abougabal, Mohamed S.
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Year:
2017
Language:
english
DOI:
10.1109/JEC-ECC.2017.8305803
File:
PDF, 125 KB
english, 2017
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