A Low-Overhead Integrated Aging and SEU Sensor

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IEEE Transactions on Device and Materials Reliability 2018

A Low-Overhead Integrated Aging and SEU Sensor

Rohbani, Nezam, Miremadi, Seyed Ghassem
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2018.2817369
File:
PDF, 2.54 MB
english, 2018
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