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[IEEE 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Honolulu, HI (2017.7.21-2017.7.26)] 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Deep Metric Learning via Facility Location
Song, Hyun Oh, Jegelka, Stefanie, Rathod, Vivek, Murphy, KevinYear:
2017
Language:
english
DOI:
10.1109/cvpr.2017.237
File:
PDF, 2.08 MB
english, 2017