[IEEE 2017 Euromicro Conference on Digital System Design (DSD) - Vienna, Austria (2017.8.30-2017.9.1)] 2017 Euromicro Conference on Digital System Design (DSD) - A Probabilistic Context-Free Grammar Based Random Test Program Generation
Cekan, Ondrej, Kotasek, ZdenekYear:
2017
Language:
english
DOI:
10.1109/DSD.2017.26
File:
PDF, 187 KB
english, 2017