[IEEE 2017 12th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Siem Reap (2017.6.18-2017.6.20)] 2017 12th IEEE Conference on Industrial Electronics and Applications (ICIEA) - A method for test case generation by improved genetic algorithm based on static structure of procedure
Jing, Wen, Yikun, Zhang, Ming, Zhao, Hao, Chen, Xinhong, Hei, Jianxiong, ShenYear:
2017
Language:
english
DOI:
10.1109/ICIEA.2017.8283076
File:
PDF, 291 KB
english, 2017