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An Erase Efficiency Boosting Strategy for 3D Charge Trap NAND Flash
Chen, Shuo-Han, Chang, Yuan-Hao, Liang, Yu-Pei, Wei, Hsin-Wen, Shih, Wei-KuanYear:
2018
Language:
english
Journal:
IEEE Transactions on Computers
DOI:
10.1109/TC.2018.2818118
File:
PDF, 579 KB
english, 2018