Low-C ESD Protection Design with Dual Resistor-Triggered...

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IEEE Transactions on Device and Materials Reliability 2018

Low-C ESD Protection Design with Dual Resistor-Triggered SCRs in CMOS Technology

Lin, Chun-Yu, Chen, Chun-Yu
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2018.2817389
File:
PDF, 1.77 MB
english, 2018
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