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[IEEE 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Honolulu, HI (2017.7.21-2017.7.26)] 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Toroidal Constraints for Two-Point Localization Under High Outlier Ratios
Camposeco, Federico, Sattler, Torsten, Cohen, Andrea, Geiger, Andreas, Pollefeys, MarcYear:
2017
Language:
english
DOI:
10.1109/cvpr.2017.709
File:
PDF, 673 KB
english, 2017