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In Situ TEM Characterization of Nanostructured Dielectrics
Hsiao, Ming-Siao, Yuan, Yifei, Grabowski, Christopher, Nie, Anmin, Shabazian-Yassar, Reza, Drummy, Lawrence F.Volume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615009848
Date:
August, 2015
File:
PDF, 336 KB
english, 2015