In Situ TEM Characterization of Nanostructured Dielectrics

Hsiao, Ming-Siao, Yuan, Yifei, Grabowski, Christopher, Nie, Anmin, Shabazian-Yassar, Reza, Drummy, Lawrence F.

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Volume:

Language:

english

Journal:

Microscopy and Microanalysis

DOI:

10.1017/s1431927615009848

Date:

August, 2015

File:

PDF, 336 KB

english, 2015

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