Depth profiling of alumina thin films using laser induced...

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Thin Solid Films 2018 / 3

Depth profiling of alumina thin films using laser induced breakdown spectroscopy: Structural and morphological dependence

Messaoud Aberkane, S., Abdelhamid, M., Yahiaoui, K., Mahieddoune, C., Abdelli-Messaci, S., Harith, M.A.
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Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2018.03.052
Date:
March, 2018
File:
PDF, 5.75 MB
english, 2018
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