[IEEE 2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) - Cancun, Mexico (2017.8.27-2017.9.1)] 2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) - Measuring the thickness of ultra-thin film layers using terahertz time-domain polarimetry (THz-TDP)

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